We demonstrate applicability of time‐resolved free‐carrier absorption and transient grating techniques for investigation of carrier recombination and diffusion features in a bulk diamond. Carrier injection into a 1 mm thick, IIa type high‐pressure high‐temperature grown layer was realized by two‐photon absorption of ∼5 ps laser pulse at 351 nm wavelength. Kinetics of differential transmission in 80–800 K range at various excess carrier densities provided carrier lifetimes of 360 ns at room temperature and their temperature dependences. A linear increase of carrier recombination rate with injection in 450–800 K range resulted in carrier lifetimes up to 1 ns and was fitted by effective coefficient B* = 2 × 10−11– 4 × 10−9 cm3/s. The latter process was attributed to a trap‐assisted Auger recombination (TAAR) with coefficient CTAAR = B*/NTrap and tentatively ascribed to nitrogen related traps. An ambipolar carrier mobility with its peak value of ∼1500 cm2/Vs at room temperature was measured by transient grating technique at ∼1.5 × 1015 cm−3 excess carrier density.
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Ščajev et al. (2011) studied this question.
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