The elemental composition of the noncrystalline intergranular phase in two MgO‐fluxed hot‐pressed silicon nitrides, determined by X‐ray microanalysis and electron energy loss spectroscopy in the transmission electron microscope, is reported. The composition is similar in both and lies near the SiO 2 ‐MgSiO 3 tie line with impurities of Ca, Al, and Cl. No nitrogen could be detected in the noncrystalline phase, implying that the nitrogen concentration was below the experimental detectability limit.
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Clarke et al. (1981) studied this question.
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