We report on the near-field imaging of silver nanoparticles using an aperture-type near-field microscope operated in illumination mode. The nanoparticles are imaged as interference patterns, due to far-field superposition of the optical fields emitted from the tip and elastically scattered from localized surface plasmons (SP). Aperture-type probe can thus be used to obtain information on the phase shift associated with localized SP coupling at the illumination wavelength.
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Prikulis et al. (2002) studied this question.
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