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The main stages in the development of the theory and technique of X-ray fluorescent analysis (XRFA) based on the method of standard scattered radiation (standard background) are considered. The applicability of different variations of the method for determining low and high concentrations is estimated. The potentialities of a new algorithm for constructing the XRFA calibration characteristic on the basis of a modified universal equation and its application for solving problems in systems of analytical control of benefication and production are demonstrated.
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A. V. Bakhtiyarov (2010) studied this question.
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