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April 1, 1992Journal of The Electrochemical SocietyOpen Access

Photoelectrochemical Measurements of Thin Oxide Films: Multiple Internal Reflection Effects

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JSJ.P.H. SukamtoWSWilliam H. SmyrlUniversity of MinnesotaCMChristopher S. McMillan

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Sukamto et al. (1992) studied this question.

synapsesocial.com/papers/6a93aacf0d47ea57beb8535ehttps://doi.org/10.1149/1.2069336
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Also Consider

Synapse has enriched 2 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1The Chemical Physics of Surfaces1978 · 709 citations
  2. 2Physics of Thin Films: Advances in Research and Development, Vol. 31968 · 117 citations