The profile-fitting method was used to analyze data, collected at speeds up to 1° (2θ) per second with a computer-controlled diffractometer, which gave precise values of intensities and angles of reflections above a selected intensity threshold level. Powder diffraction data with 52 reflections in a 40° range were collected and analyzed in a few minutes. This technique has also been applied to X-ray fluorescence spectroscopy, and is applicable to single-crystal diffractometry and wavelength-dispersive electron microprobe analysis.
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Ayers et al. (1978) studied this question.