A computer program, used to ‘curve‐fit’ complex spectra of overlapping peaks in other spectral applications, has been used with X‐ray fluorescence data. Compensation is made for analytical error introduced through peak overlap. A typical case of this ‘inter‐element interference’, that of titanium upon vanadium, is taken to demonstrate the method. A comparison between the computer‐generated results and those determined by the conventional inter‐element correction method favours the curve‐fitting procedure.
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Riddle et al. (1977) studied this question.
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