A new frequency-domain wave-propagation model that includes a position- and time-dependent carrier lifetime and the effect of amplified spontaneous emission is introduced and used to accurately simulate recovery time experiments in 0.5- and 1.0-mm long semiconductor optical amplifiers. It is compared to a constant lifetime model at different saturation levels, showing better performance and consistency. The role of the amplified spontaneous emission in saturated amplifiers is also discussed.
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Gutiérrez-Castrejón et al. (2000) studied this question.
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