The effects of He/N2 reactive gas composition on the structural and electrical properties of InN thin films deposited by magnetron sputtering on A1N-nucleated (00.1) sapphire substrates have been investigated. X-ray scattering studies demonstrate that the films are an aggregate of strained heteroepitaxial domains and highly relaxed textured domains and that their apportionment is strongly tied to the reactive gas composition. The sputtering rate, as evidenced by film thickness, nominally increases with increasing volume fraction of N2, but enhanced growth and epitaxial volume are observed at concentrations of N2 near 60%. The variation in electrical transport properties with increasing N2 fraction in the gas mixture is smoother, with the n-type Hall mobility rising monotonically from 35 cm2 V−1 s−1 for films deposited in a 30% N2 volume fraction to 55 cm2 V−1 s−1 for growth in pure N2, largel y due to an increase in the volume of heteroepitaxial domains, the consequent reduction in the density of high-angle grain boundaries, and the resulting decrease in intergrain resistance and film resistivity.
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Bryden et al. (1994) studied this question.
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