Domain analysis of amorphous CoZrRe film

A previously presented method which focuses on the static conditions in crystalline films is useful for confirming the domain configuration by minimizing the total free energy in the films. This method is also highly applicable to amorphous films. This paper indicates that a stiffness constant, anisotropy constant and wall type can be reasonably assumed in the same manner as in the crystalline case. Domain structure in amorphous films can be analyzed for a wide range of magnetic anisotropy field and thickness with respect to domain wall type. Therefore, this method is very convenient for designing film heads or MR heads using amorphous films capable of achieving high saturated flux density and high permeability.