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April 15, 1987Journal of Applied Physics

Effect of deposition parameters on rf sputtered CoZr and CoZrRe thin films for magnetic recording heads

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Authors

JGJ.I. GuzmanSeagate (United States)MKM.H. KryderCarnegie Mellon University

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Guzman et al. (1987) studied this question.

synapsesocial.com/papers/6a93b566bda3c58f3b453fc6https://doi.org/10.1063/1.338915
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Also Consider

Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1Magnetic properties of ion beam sputtered Co-Zr and Co-Zr-Re amorphous films1985 · 27 citations
  2. 2Deposition of amorphous Co-Ta and Co-Zr thin films by means of double ion beam sputtering1984 · 17 citations
  3. 3Sputtering of amorphous Co-Zr and Co-Hf films with soft magnetic properties1982 · 88 citations
  4. 4Preparation and properties of coevaporated amorphous Co-Zr thin films1982 · 28 citations
  5. 5Properties of amorphous Co–Ta and Co–W films deposited by rf sputtering1982 · 34 citations