In a new combined atomic force microscope/scanning electron microscope, we have been able to fabricate and test electron-beam-deposited tips (e-beam tips). With this instrument it was possible to test newly grown e-beam tips within a few minutes of their formation, without ever breaking vacuum. Typical results on oxide-sharpened conventional tips showed that the radius of curvature could be reduced by a factor of 2.5 with the e-beam tips.
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Walters et al. (1994) studied this question.
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