We report the observation of porous structures in laser-ablation-deposited Y2O3:Eu thin films and their correlation with luminescent properties by a combination of transmission electron microscopy and Z-contrast scanning transmission electron microscopy (Z-STEM). Depending on growth conditions, a large density of voids is incorporated into the films, which leads to a much increased surface area. Cathodoluminescence imaging in the STEM directly reveals a 5 nm “dead layer” around each void, which is responsible for the observed reduction in luminescence efficiency.
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Gao et al. (2000) studied this question.
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