Charge-magnetic roughness correlations of the Gd layers in an Fe/Gd multilayer are studied using diffuse, x-ray resonant magnetic scattering. The strong interfacial coupling exhibited by this system, which restricts the orientation of the magnetic moments, makes possible a detailed study of the intrinsic charge-magnetic roughness. Quantitative analysis of the data is carried out by using a newly developed model, based on the Born approximation, for diffuse, x-ray resonant magnetic scattering from multilayers. Fits to the charge and charge-magnetic interference data result in longer correlation lengths for both in-plane and out-of-plane charge-magnetic roughness than for charge roughness.
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Nelson et al. (1999) studied this question.
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