Negative pressure slider-type film heads for thin film media were designed with regard to head/medium interface property and element reliability. A Zn-ferrite substrate and SiO2protective cover layer were used in slider fabrication to improve the head/ medium interface and etching characteristics for the negative pressure slider. Numerical analysis for designing the heads indicates that SiO2insulating layer improves transducer thermal reliability. Also, an optimised yoke pattern contributes to obtain sufficient write field and reproduction efficiency. The new head was subjected to a 20,000-cycle contact start/stop test and read/write test.
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Mikazuki et al. (1985) studied this question.
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