Experimental study reveals defect engineering boosts light yield while preserving ultrafast decay in β-Ga2O3 scintillators, highlighting defect-assisted luminescence for radiation imaging.
Scintillator development has long been constrained by the trade‐off between decay time and light yield. Here, we reported a counterintuitive defect engineering strategy that successfully reconciles these conflicting metrics in β ‐Ga 2 O 3 . Through controlled atmosphere annealing, a specific configuration of gallium vacancies (V Ga ) is intentionally introduced which function as relay levels for energy transfer, effectively redirecting carriers toward self‐trapped exciton (STE) luminescence channels. The optimized β ‐Ga 2 O 3 scintillator achieves a high light yield of 9647 ph/MeV, representing a 1.38‐fold enhancement over the unannealed crystal (6971 ph/MeV). Remarkably, this substantial improvement is attained while preserving the material's intrinsically ultrafast decay time (∼9.1 ns). Furthermore, the material demonstrates an outstanding spatial resolution of 19 lp mm −1 , nearly twice that of the commercial benchmark CsI:Tl scintillator (∼10 lp mm −1 ). This work not only overturns the traditional perception of defects merely as non‐radiative recombination centers but also establishes defect‐assisted luminescence as a design principle for synergistically boosting the light yield and speed of wide‐bandgap oxide scintillators.
No takes yet. Share an insight, caveat, or question.
Liu et al. (2026) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: