Dissociative and double photoionization of SF6 in the 75–125 eV region

Partial cross sections for the singly charged fragments [SFm+(m = 0–5)] and F+ and the doubly charged fragments [SFn2+(n = 0–4)] in SF6 have been measured using a time-of-flight mass spectrometer and synchrotron radiation in the 75–125 eV region. The mass spectrometer collected a constant fraction of all the fragments produced including energetic ones, thus providing true fragmentation yields. The relatively large production rate of double ionization is demonstrated.