Application of rapid‐response voltammetry to stripping analysis was carried out, and novel fast scan stripping voltammetry (FSSV) was developed. A remarkable increase in analytical sensitivity could be attained as a result of the minimization of the background current through the use of an ultramicrodisk electrode (UMDE) and the fast scan rate of 300 V/s. The interference of dissolved oxygen and copper ion were greatly eliminated owing to their slow charge transfer rate. This new type of stripping method also turned out to be a rapid and reliable analytical method.
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Nomura et al. (1991) studied this question.
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