Epitaxial pseudomorphic films of Cu have been grown on Pt{001} to thicknesses of 15--17 layers. A quantitative low-energy electron-diffraction intensity analysis of a ten-layer film reveals that the in-plane lattice constant is that of the Pt{001}1×{}1 net (a₀=3.93 {}), and that the bulk interlayer spacing is 1.62±{}0.04 {}. Strain analysis shows that this structure is derived from the fcc structure of Cu with a plane strain of about 9%, similar to Cu films grown on Pd{001}.
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Li et al. (1991) studied this question.
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