Ultra-thin Co/Cr films were fabricated by RF diode sputtering. The highly exchange coupled Co grains were successfully isolated by post deposition processing. The microstructure was studied with TEM and a very small physical grain size was observed. The measurement of /spl Delta/M curves showed that the grain to grain interaction changed from positive to negative. Time dependent magnetic measurements showed significant thermal decay effects. It was also found that the use of CrMn underlayers instead of pure Cr further isolated the Co grains.
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Gong et al. (1998) studied this question.
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