Small Angle Electron Scattering from Vacuum Condensed Metallic Films II. Experimental Results

The electron microscope is used as a small angle diffraction camera, with an angular resolution of about 5 × 10−6 rad, to investigate the structure of some vacuum deposited metallic films. Film structure is sensitive to condensation rate and radiant heat received from the vapour source. The growth of crystallites as separate columns is favoured by slow condensation rates in the case of nickel, permalloy, and palladium whilst at faster rates the films become continuous at an earlier stage in their growth. The sensitivity of the diffraction effects on the film structure is demonstrated and the general relations proposed in Part I are verified.