This paper describes a technique, using rectangular or circular open-ended waveguides, for the nondestructive measurement of dielectric material properties. The results of a detailed mathematical analysis are used to obtain a simple expression yielding the complex permittivity in terms of the measured complex reflection coefficient. This method brings the problem within the scope of minicomputers.
No takes yet. Share an insight, caveat, or question.
Sphicopoulos et al. (1985) studied this question.
Synapse has enriched 5 related papers. Consider them for comparative context: