Far-infrared transmittance and reflectance of PbTiO 3 , PbZr 0.53 Ti 0.47 O 3 and PbZr 0.75 Ti 0.25 O 3 thin films deposited by a sol-gel technique on sapphire substrates were measured between room temperature and 650 degrees C. The spectra were fitted with a classical oscillator model to calculate the dielectric response. Polar-mode parameters are more accurate than data on bulk ceramic materials and are in good agreement with them. An analysis of the soft-mode behaviour and comparison with the low-frequency permittivity data clearly indicate the existence of additional relaxation that is always present in the several cm -1 range, even at room temperature.
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Fedorov et al. (1995) studied this question.
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