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We use a new method for visualization and direct experimental study of dynamic magnetization processes and for nondestructive characterization of the defect structure of magnetic multilayers. The method utilizes a transparent indicator ferrimagnetic magneto-optic film with in-plane anisotropy. An example of its application to the investigation of the magnetization reversal by domain wall motion in electrochemically produced CoNiCu/Cu multilayers which exhibit a giant magnetoresistance effect is described.
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Bennett et al. (1995) studied this question.
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