Linear extrinsic defects can be embedded inside the lattice of a silica colloidal photonic-crystal film via a directed self-assembly strategy involving a combination of top–down photolithography and bottom–up colloidal assembly. High-spatial-resolution scanning micro-optical spectroscopy proves to be an effective means of characterizing the photonic crystal properties of the buried defects (see Figure) within the film.
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Vekris et al. (2005) studied this question.
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