Experimental study demonstrates convergent-beam X-ray diffraction for multi-scale crystal imaging, indicating improved characterization of internal strain, defects, and morphology.
Key Points
To establish convergent-beam X-ray diffraction for acquiring spatially resolved structural information across both atomic and macroscopic length scales in crystals.
Implemented convergent-beam X-ray diffraction using highly focusing multilayer Laue lenses.
Mapped Bragg reflections into projection topographic and tomographic images to resolve crystal defects and internal morphology.
Enabled high-resolution spatial mapping of lattice strain and internal structural defects within crystalline materials.
Demonstrated the capability to incorporate local crystal morphology when determining structure factors as a function of position.