Total dose hardness assurance techniques for new generation COTS devices

Hardness assurance techniques and total dose radiation characterization data for new generation linear and COTS devices from various manufacturers are presented. A bipolar op amp showed more degradation at high dose rate than at low dose rate, which is opposite to the behavior of many other bipolar linear devices. New generation low-power op amps showed more degradation in electrical parameters with total power supply voltage of 3 V than at higher voltages. Minimum operating voltage is an important characterization parameter for newer low-power linear circuit designs.