Systematic measurements of W, Ir, Pt, Au, Hg, Tl, Pb, and Bi tracer diffusion have been performed in melt-spun amorphous Pd₇₈{Cu}₆Si₁₆ ribbons. The impurities were introduced by ion implantation, and diffusional changes of the depth profiles were measured by Rutherford backscattering spectrometry. The observed differences in the diffusivities of various ions are discussed and compared with published data.
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ttiger et al. (1988) studied this question.
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