Correlation between noise-after-write and magnetization dynamics in thin film heads

Correlation between noise-after-write and magnetization dynamics in 30-turn electroplated thin-film heads has been investigated by utilizing two complementary magnetooptic Kerr-effect domain imaging systems and a Barkhausen noise tester. It has been found that heads containing spike-like domains near the backgap closure have significantly higher noise-after-write rates than heads with normal closure domain configurations. A longitudinal 180 degrees wall in the direction of flux conduction at the sloped region of the pole tip was observed, however, regardless of whether the head had a high or low noise-after-write rate.>