A theoretical model is suggested which describes the formation of nano-wires associated with compositional inhomogeneities in multilayered films. General formulae are found relating characteristic length scales of compositional inhomogeneities in film layers and geometric parameters (layer thickness values, misfit parameters) of the multilayered film. The exact relationship between such length scales and parameters is revealed and analysed in detail in the exemplary case of three-layer films.
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Ovid’ko et al. (2001) studied this question.
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