The continuing development of X-ray light sources, optical devices and image analy- sis technologies enables us to nondestructively analyze internal structures of materials by using 3D imaging with a spatial resolution of micron, even dozens of nanometers. Innovations in materials sci- ence and technology will benefit from the new achievements of the X-ray tomography with higher resolution. This article devotes to review the origination and development of the X-ray tomography techniques for 3D imaging and introduce the principles and specifications of three imaging methods, including absorption imaging, phase contrast imaging and holographic imaging. The differences be- tween synchrotron-based and laboratory-based X-ray tomography are also discussed. To explore new opportunities of the high resolution X-ray tomography in the development of material science and technology, particular emphasis is laid on the applications for traditional materials with a 3D view, such as the characterizations of holes, cracks, corrosion, composites, and in situ testing etc..
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Wang et al. (2013) studied this question.
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