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April 6, 1992Applied Physics Letters

Defects in amorphous silicon probed by subpicosecond photocarrier dynamics

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PSP.A. StolkNXP (Netherlands)LCLucio CalcagnileUniversity of SalentoSRS. RoordaUniversité du Québec à Montréal

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Stolk et al. (1992) studied this question.

synapsesocial.com/papers/6a945fe2beb4e1ebf564cddbhttps://doi.org/10.1063/1.107212
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