The effect of rise time and field gradient on nonlinear bit shift in thin film heads

We present a discussion of nonlinear bit shift in thin film inductive heads. A three dimensional finite element model and two dimensional dynamic and self consistent model were used to calculate the nonlinear bit shift as a function of rise time, write current waveform and pole tip saturation. The analysis shows a strong dependency of nonlinear bit shift on rise time and write pole magnetic image. A comparison of experimental data with the theoretical model is presented.>