Hydrogen uptake and optical properties of sputtered Mg–Ni thin films

The hydrogen uptake and distribution in wedged Mg–Ni films, with composition ranging from Mg 0.85 Ni 0.15 to Mg 0.55 Ni 0.45 , were investigated. Upon hydrogen loading at 298 K these films undergo a transition from a mirror-like metallic to a semiconducting transparent state. After exposure to a hydrogen pressure of 1 bar, the samples exhibit large variation in optical appearance, ranging from a pale yellowish (Mg rich side) to a brownish shade (Ni rich side). The change in the effective optical band gap E g eff as a function of sample composition and hydrogen concentration was determined; it showed changes from 3.6 eV in the Ni poor domain to 2.4 eV in the Ni rich domain. Composition analysis using the 15 N nuclear resonance method showed close to homogeneous hydrogen distribution throughout the film and close to linear increase in the hydrogen uptake with increasing Mg content. The thermal stability of the films is limited; annealing above 393 K results in significant redistribution of the constituents. Mg is enriched at the surface, reacting with Pd and thereby degrading the capping layer through the formation of Mg 6 Pd and MgO, as determined by x-ray diffraction, x-ray photoelectron spectroscopy and Rutherford backscattering studies. This redistribution results in a severe decrease of the hydrogen uptake rate, as monitored by in situ resistivity measurements.