Probing correlated current and force effects of nanoparticle charge states by hybrid STM-AFM

By using an atomic force microscope (AFM) cantilever as a substrate for a scanning tunneling microscope (STM), we can simultaneously probe currents I and forces F in a tunnel junction as a function of bias voltage V. Measurements performed using gold-nanoparticle (NP) coated cantilevers under ambient conditions reveal correlated kinks in both I-V and F-V curves. Changes in background charge distributions, which have been problematic in controlling single charges in such systems, can be readily detected by the hybrid STM-AFM. To test whether we can statistically attribute observed kinks to Coulomb staircase phenomena, we have performed measurements using NP's of different sizes. NP's 4.8 and 2.5 nm in diameter exhibit kinks spaced on average 0.22 and 0.52 V apart, respectively. These values are in good agreement with a metallic sphere--flat surface model for the STM tip--NP capacitance and the orthodox model for single-electron tunneling.