Electroformed metal-insulator-metal diodes showing voltage controlled negative resistance are investigated with a scanning tunnelling microscope. The topography and the potential distribution are recorded simultaneously at various voltages applied across the sample. The sharp potential drop in the microslit suggests a layer model with current carrying filaments between the layers. Material transport in the vicinity of the potential drop may be an indication of the existence of hot spots.
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Pagnia et al. (1990) studied this question.
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