Narrow-band-noise generation in charge-density-wave compounds

The absolute magnitude of the narrow-band noise is estimated within the framework of the Fukuyama-Lee-Rice model. The noise is predicted to vary with sample volume scrV as scrV^-1/2, as has been previously noted, and with impurity concentration nᵢ as nᵢ1/2. Experiments on the sliding charge-density wave in NbSe₃ agree with both of these predictions. The predicted magnitude differs from that observed in NbSe₃, but it is in quantitative agreement with data for the charge-density waves in K0.3{MoO}₃$ and (${TaSe}₄)₂I. These results provide additional evidence both for bulk narrow-band-noise generation and for weak pinning.