High-resolution domain imaging on the nonpolar y-face of periodically poled KTiOPO4 by means of atomic force microscopy

The inverse piezoelectric effect is used to produce high-resolution images of ferroelectric domains in periodically poled KTiOPO4 crystals on their nonpolar y-face using atomic force microscopy. We demonstrate that the technique is convenient for studying the nucleation and growth of domains in a periodically poled KTiOPO4 sample.