The electrical resistivity of magnetron-sputtered polycrystalline NbN thin films has been measured as a function of the temperature for a variety of samples exhibiting different grain structures. The data are very well described by a model recently proposed by Reiss, Vancea, and Hoffman for granular metallic systems. The model correctly predicts the observed negative temperature coefficient of resistivity and the occurrence of a minimum in the temperature dependence of the resistivity.
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Nigro et al. (1988) studied this question.
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