Answers are grounded in this paper and cite their sources.
The current capacity of a solid-state device, as ordinarily rated, varies widely depending on the current waveform, duty cycle, case temperature, etc. The underlying junction temperature limits should, however, be invariant.
No takes yet. Share an insight, caveat, or question.
W.E. Newell (1976) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: