A 20-cm clear aperture modified Twyman-Green interferometer is described. The system measures phase with an AC technique called phase-lock interferometry while scanning the aperture with a dual galvanometer scanning system. Position information and phase are stored in a minicomputer with disk storage. This information is manipulated with associated software, and the wavefront deformation due to a test component is graphically displayed in perspective and contour on a CRT terminal.
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Moore et al. (1978) studied this question.
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