We have measured the deposition of potential energy of slow (~6×10⁵m/s), highly charged ions in solids with an ion implanted silicon detector. A large fraction (about $35%$ or 60 keV) of the potential energy dissipated by Au⁶⁹⁺ ions can be traced in electronic excitations deep (>50nm) inside the solid. In contrast, only about $10%$ of the potential energy has been accounted for in measurements of emitted secondary particles.
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Schenkel et al. (1999) studied this question.
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