Parametric physical mapping model for metasurfaces analysis and design for electromagnetic targets

This is the authors' abstract. We don't add key points for this paper.

The efficient analysis and design of metasurfaces for electromagnetic (EM) targets is a core issue in the field of metasurfaces applications. The bottleneck lies in the lack of intuitive and parametric mapping relationships between structural parameters and EM characteristics, which leads to low design efficiency. Measurement and computational EM methods are relatively straightforward methods to analyze and design metasurfaces, but both are time-consuming in most cases. In addition, most of the current analysis methods for metasurfaces are only tailor-made for two-dimensional structures, and set obstacles for three-dimensional targets. To address the above bottleneck, a parameterized physical model for mapping structural parameters and EM characteristics is proposed in this work, which has concise intuitiveness and stable generality in space. Selecting the reflection coefficient as the linking factor, the equivalent circuit model regards structures as lumped elements and the derived Physical Optics-based computational EM model is integrated to construct a strategy for EM metasurface design, which attaches the function of forward-inverse deduction. Experiments on calculation, simulation, fabrication and measurement are conducted to verify the efficiency of multi-scopes, including accuracy in broadband, feasibility in multi-sizes, flexibility in multi-working modes, stability in future targets and practicality for real applications. In particular, the average root mean-square errors of all the results are only 1.93%. Furthermore, the proposed model provides reliable physical guidance for designing and constructing metasurface-parameterized models on complex EM targets.