Emission enhancement from ZnO thin films coated with Al∕AlOx has been studied by photoluminescence spectroscopy. While Al exhibits a moderate enhancement on ZnO, the introduction of an ultrathin AlOx spacer can increase the luminescence significantly. By examining the dependence of light emission of Al∕AlOx∕ZnO on AlOx thickness, we found, other than the surface plasmon mediation, a short-ranged nonradiative channel that plays a crucial role in determining that the overall emission enhancement is also present. Based on a simple analytical model, it is found that the nonradiative process is strongly dependent on (AlOxthickness)−6 and therefore its origin is suggested to be of Förster type. Finally, an AlOx spacer with thickness of 5nm is found to be adequate to eliminate the unwanted quenching effect.
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Ni et al. (2006) studied this question.
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