New applications of a 128×128 channel, computer controlled, dual parameter analyzer used to record, compute, and display solid state laser emission and propagation data are described. The pulse height analysis coincidence mode is used to make spike amplitude measurements on reference and propagated signals or make spike coincidence measurements on two spectrometer output signals. An X-Y contour mode display provides a real time visual indication of results for wavelength dependent absorption tests, cavity mode tests, and beam cross section studies. A description of an operating system and initial test results are presented.
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Schleusener et al. (1972) studied this question.
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