Attenuated Total Reflection Fourier Transform Infrared Spectroscopy Study of Poly(methyl methacrylate) Adsorption on a Silica Thin Film: Polymer/Surface Interactions

ADVERTISEMENT RETURN TO ISSUEPREVNoteNEXTAttenuated Total Reflection Fourier Transform Infrared Spectroscopy Study of Poly(methyl methacrylate) Adsorption on a Silica Thin Film: Polymer/Surface InteractionsJean-Marc Berquier and Hervé ArribartView Author Information Laboratoire CNRS Saint-Gobain, "Surface du Verre et Interfaces" 39, Quai Lucien Lefranc, F-93304 Aubervilliers, France Cite this: Langmuir 1998, 14, 13, 3716–3719Publication Date (Web):June 3, 1998Publication History Received17 April 1997Revised22 December 1997Published online3 June 1998Published inissue 1 June 1998https://pubs.acs.org/doi/10.1021/la9703961https://doi.org/10.1021/la9703961brief-reportACS PublicationsCopyright © 1998 American Chemical SocietyRequest reuse permissionsArticle Views361Altmetric-Citations33LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstract