Adhesion in organic electronic structures

This paper presents the results of atomic force microscopy (AFM) measurements of the adhesion between materials relevant to organic solar cells and organic light-emitting devices. The adhesion is quantified using pull-off forces obtained for organic-organic, organic-inorganic, and inorganic-inorganic interfaces. The measured pull-off forces and surface parameters are then incorporated into theoretical models for the estimation of surface energies. The implications of the results are then discussed for the design of enhanced robustness in organic electronic structures.