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A Schottky junction in the configuration ITO/nano-CdS/Au has been fabricated and the current(I)–voltage(V) and capacitance(C)–voltage(V) characteristics studied. The I–V studies show series resistance effect resulting in two ideality factors: one in low and the other in high forward bias regime, suggesting the presence of surface/interface traps in nano-CdS. Frequency dependent capacitance has also been studied and different semiconductor parameters have been estimated from the I–V and C–V analysis.
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Patel et al. (1999) studied this question.
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