The diode forward voltage method with pulsed currents was widely used for monitoring junction temperature (Tj) of light-emitting diodes (LEDs). However, a thermal transient effect (TTE) was observed by the pulsed currents and consequent errors were introduced. Thermoelectric physics was conducted to explain this phenomena and a group of experiments was used to reveal the TTE during Tj measurement for high-voltage (HV) LEDs. In addition, an improved pulse-free direct junction temperature measurement method was conducted for HV LEDs to reduce the errors and to achieve in situ Tj measurement with dc currents, simpler setups, and a less step sequence.
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Ye et al. (2013) studied this question.
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