Answers are grounded in this paper and cite their sources.
While the literature contains many contactless resistivity measurement methods suitable for fairly large spherical, cylindrical and rectangular geometries, few of these are designed for small samples. After a literature review, a variable-temperature technique which is well adapted to small circular wafers is presented.
No takes yet. Share an insight, caveat, or question.
McRae et al. (1980) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: